The Centre of Excellence in Steel Technology at IIT Bombay organised a lecture titled "Forensic Analysis of Plastic Strain for Complex Deformation Processes" as a part of the “Steel Colloquium Series” on February 20, 2018 delivered by Prof. David P. Field, Washington State University, USA
Prof. David P Field is a faculty at School of Mechanical Materials Engineering and is currently the Associate Dean of Research and Graduate Education at Voiland College of Engineering and Architecture at Washington State University, Pullman, USA. Prof. Field graduated at Yale University in 1991 with PhD in Mechanical Engineering. He is the Acting Director of Joint Center for Deployment and Research in Earth Abundant Materials (JCDREAM). He started his career as an Engineer at Alcoa Technical Center, USA in 1991. From 1994 to 2000, he served as Director of Technology for TexSEM Laboratories (the company that invented OIM). He is a Fellow of American Society for Materials International (2013). His research interests are physical and mechanical metallurgy, metal deformation and recrystallization, crystallographic texture, grain boundary structure, thin film and IC interconnect structure/properties relationships and advanced experimental techniques.
Below is a brief abstract of the lecture:
Severe plastic deformation techniques have been used to develop structures with fine grain sizes in an attempt to improve the resultant mechanical properties. The processes employed typically involve complex flow patterns and sometimes recrystallization in either dynamic or static conditions. This presentation focused on microstructures observed from specimens produced by friction stir welding in various configurations, and from shear assisted, indirect pipe extrusion. The microstructure evolution during these processes are complex and result in structural gradients during the forming process before the final structure is reached. Textural analysis is used to back out the material flow during these processes by identifying the major shear plane and directions as indicated from the observed textures. Measurements for these studies were made using electron backscatter diffraction.